Vision-Based Inspection Solution for Photovoltaic
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PEPL Inspection Module for Crystalline Silicon Cells


Defect Images
SL-A300 (PE Section)
  • Capacity
    <6000 Pcs/H
  • Maximum Inspection Accuracy
    0.1m (4K line scan camera)
  • Miss Inspection Rate
    ≤ 0.1%
  • Wrong Inspection Rate
    ≤ 0.3%
  • Repeatability
    ≥ 99%
SL-B300 (PL Section)
  • Capacity
    <6000 Pcs/H
  • Maximum Inspection Accuracy
    60μm (4K line scan camera)
  • Miss Inspection Rate
    Scratch miss inspection rate < 0.3%
    black hemp < 0.3%
    other defects ≤ 0.1%
  • Wrong Inspection Rate
    ≤ 1%
  • Repeatability
    ≥ 99%