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Vision-Based Inspection Solution for Photovoltaic
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Photovoltaic

PL Inspection Module for Crystalline Silicon Cells

Product Advantages

· Shortened inspection cycle (deep learning and AI acceleration)

· Full-process and high-speed online or offline inspection, regardless of processes

· Customized report function (entropy chart)

Defect Images
PL-D300
  • Capacity
    <6000 Pcs/H
  • Maximum Inspection Accuracy
    60 μm (4K line scan camera)
  • Miss Inspection Rate
    Scratch miss inspection rate ＜ 0.3%
    black hemp ＜ 0.3%
    other defects ≤ 0.1%
  • Wrong Inspection Rate
    ≤1%
  • Repeatability
    ≥ 99%
PL-D300
  • Capacity
    ≤3600 Pcs/H
  • Maximum Inspection Accuracy
    0.24m (1K line scan camera)
  • Miss Inspection Rate
    Scratch miss inspection rate ＜ 5%
  • Wrong Inspection Rate
    ≤ 1%
  • Repeatability
    ≥ 99%
  • *Note
    Due to the wide coverage of offline defects and uncertainty, the above defects are for offline judgment of personnel only, not to do all automatic inspection.