Vision-Based Inspection Solution for Photovoltaic
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Watermark Inspection Module for Crystalline Silicon Cells

Mainly used for chain down cleaning machine, PSG, BSG, alkali polishing after the inspection of large fragments, over-carving, with liquid, stacked pieces and other defects.


Product Advantages

· Line sweep solution with pure background

· With deep learning inspection to reduce dirty misclassification

· Flexible binning criteria


Defect Images
SY-B100SC1
  • Capacity
    Max 4500 Pcs/H (single track)
  • Maximum Inspection Accuracy
    110μm (two lanes at a time) / 185μm (three lanes at a time)
  • Equipment Availability
    99%
  • Repeatability
    99% (determined by testing standards)
  • Inspection Mode
    Flow film inspection
  • Wrong Inspection Rate
    ≤ 0.1%
  • Miss Inspection Rate
    ≤ 0.1%
  • Dimension
    2300mm*600mm*350mm (eight lanes for example)
  • Weight
    15KG (eight lanes for example)
  • Voltage
    220V AV
  • Power
    1.5KW (eight lanes for example)