IntelliBlink-AI is an AI platform independently developed by LEAPER for the field of vision inspection. It provides functions including sample labeling, sample generation, model training, model validation, data visualization and open integration for user-defined models. It supports applicaitons such as image classification, object detection, image segmentation and unsupervised anomaly detection. One of its key features is image sample generation, which can create a large number of training images from a very small set of samples, effectively addressing a major challenge in rapidly deploying vision AI projects in industrial scenarios. After importing the AI models into PICS —— also independently developed by LEAPER and integrating high-speed, high-precision defect detection and other functionalities —— the efficiency of defect inspection in the semiconductor packaging industry can be significantly improved.